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LOCHITT - Low Cost High Temperature Test system - Application examples



Figure 1 shows the bit map of a small memory which was continuously subjected to a MARCH test whilst in an environmental chamber at a temperature of 200ºC for over a period of several tens of hours. IDDQ measurements can also be done during the MARCH test, the results of which are shown in Figure 2 with a ‘current signature’, being generated from them, shown in Figure 3.

Figure 1: Memory Bit Map
(Black dots – Faulty Cells)

 

Simple test on a DAC:

Figure 4 shows the how the AWG can be used to create a simple functional test for a DAC. The waveform is drawn, converted to a digital form and then applied to the DAC.




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