LOCHITT - Low Cost High Temperature Test system -
Figure 1 shows the bit map of a small memory which was continuously
subjected to a MARCH test whilst in an environmental chamber at a
temperature of 200ºC for over a period of several tens of hours.
IDDQ measurements can also be done during the MARCH test, the
results of which are shown in Figure 2 with a ‘current signature’,
being generated from them, shown in Figure 3.
Figure 1: Memory Bit Map
(Black dots – Faulty Cells)
Simple test on a DAC:
Figure 4 shows the how the AWG can be used to create a simple
functional test for a DAC. The waveform is drawn, converted to a
digital form and then applied to the DAC.
Please contact us for further information